Dr. Eric M. Dufresne
Beamline Scientist at Argonne National Lab
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 13 September 2006
Proc. SPIE. 6317, Advances in X-Ray/EUV Optics, Components, and Applications
KEYWORDS: Lithium, Lenses, Photons, X-rays, Refraction, Solids, Beryllium, Tolerancing, X-ray technology, Absorption

Proceedings Article | 4 November 2004
Proc. SPIE. 5539, Design and Microfabrication of Novel X-Ray Optics II
KEYWORDS: X-ray optics, Lithium, Scattering, Crystals, X-rays, Diagnostics, Refraction, Solids, Charge-coupled devices, X-ray imaging

Proceedings Article | 3 November 2004
Proc. SPIE. 5537, X-Ray Sources and Optics
KEYWORDS: Multilayers, Sputter deposition, X-rays, X-ray diffraction, Interfaces, Silicon, Reflectivity, Synchrotron radiation, Monochromators, Absorption

Proceedings Article | 23 December 2003
Proc. SPIE. 5195, Crystals, Multilayers, and Other Synchrotron Optics
KEYWORDS: Mirrors, Multilayers, Glasses, Crystals, X-rays, Silicon, Coating, Reflectivity, Solids, Charge-coupled devices

Proceedings Article | 6 December 2001
Proc. SPIE. 4502, Advances in Laboratory-based X-Ray Sources and Optics II
KEYWORDS: X-ray optics, Lithium, Teeth, Lenses, Signal attenuation, Metals, Manufacturing, Geometrical optics, Beryllium, Absorption

Showing 5 of 6 publications
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