We are developing a novel diagnostic for measurement of bulk fluid motion in materials, that is particularly applicable to
very hot, x-ray emitting plasmas in the High Energy Density Physics (HEDP) regime. The X-ray Doppler Velocimetry
(XDV) technique relies on monochromatic imaging in multiple x-ray energy bands near the center of an x-ray emission
line in a plasma, and utilizes bent imaging crystals. Higher energy bands are preferentially sensitive to plasma moving
towards the viewer, while lower energy bands are preferentially sensitive to plasma moving away from the viewer.
Combining multiple images in different energy bands allows for a reconstruction of the fluid velocity field integrated
along the line of sight. We review the technique, and we discuss progress towards benchmarking the technique with
proof-of-principle HEDP experiments.
Visible spectroscopic techniques are often used in plasma experiments to measure B-field induced Zeeman splitting, electron densities via Stark broadening and temperatures from Doppler broadening. However, when electron densities and temperatures are sufficiently high, the broadening of the Stark and Doppler components can dominate the emission spectra and obscure the Zeeman component. In this research, we are developing a time-resolved multi-axial technique for measuring the Zeeman, Stark, and Doppler broadened line emission of dense magnetized plasmas for Z-pinch and Dense Plasma Focus (DPF) accelerators. The line emission is used to calculate the electron densities, temperatures, and B-fields. In parallel, we are developing a line-shape modeling code that incorporates the broadening effects due to Stark, Doppler, and Zeeman effects for dense magnetized plasma. Experiments conducted at the University of Nevada (Reno) at the Nevada Terawatt Facility (NTF) using the 1 MA Z-pinch (Zebra). The research explored the response of Al III doublet, 4p 2P3/2 to 4s 2S1/2 and 4p 2P1/2 to 4s 2S1/2 transitions. Optical light emitted from the pinch is fiber coupled to high-resolution spectrometers. The dual spectrometers are coupled to two high-speed visible streak cameras to capture time-resolved emission spectra from the experiment. The data reflects emission spectra from 100 ns before the current peak to 100 ns after the current peak, where the current peak is approximately the time at which the pinch occurs. The Al III doublet is used to measure Zeeman, Stark, and Doppler broadened emission. The line emission is then used to calculate the temperature, electron density, and B-fields. The measured quantities are used as initial parameters for the line shape code to simulate emission spectra and compare to experimental results. Future tests are planned to evaluate technique and modeling on other material wire array, gas puff, and DPF platforms.
This work was done by National Security Technologies, LLC, under Contract No. DE-AC52-06NA25946 with the U.S. Department of Energy and supported by the Site-Directed Research and Development Program. DOE/NV/25946--2749.
X-ray Diodes (XRDs) are currently used for spectroscopic measurements, measuring X-ray flux, and estimating spectral shape of the VUV to soft X-ray spectrum. A niche exists for an inexpensive, robust X-ray diode that can be used for experiments in hostile environments on multiple platforms, including explosively driven experiments that have the potential for destroying the diode during the experiment. A multiple channel stacked filtered array was developed with a small field of view where a wider parallel array could not be used, but filtered channels for energies lower than 1000 eV were too fragile to deploy under normal conditions. To achieve both the robustness and the required low-energy detection ability, we designed a small low-energy mirrored channel with a spectral sensitivity from 30 to 1000 eV. The stacked MiniXRD X-ray diode system design incorporates the mirrored low-energy channel on the front of the stacked filtered channels to allow the system to work within a small field of view. We will present results that demonstrate this is a promising solution for low-energy spectrum measurements.
There are many types of X-ray diodes that are used for X-ray flux or spectroscopic measurements and for estimating the spectral shape of the VUV to soft X-ray spectrum. However, a need arose for a low cost, robust X-ray diode to use for experiments in hostile environments on multiple platforms, and for experiments that utilize forces that may destroy the diode(s). Since the typical proposed use required a small size with a minimal single line-of-sight, a parallel array could not be used. So, a stacked, filtered multi-channel X-ray diode array was developed, called the <strong>MiniXRD</strong>. To achieve significant cost savings while maintaining robustness and ease of field setup, repair, and replacement, we designed the system to be modular. The filters were manufactured in-house and cover the range from 450 eV to 5000 eV. To achieve the line-of-sight accuracy needed, we developed mounts and laser alignment techniques. We modeled and tested elements of the diode design at NSTec Livermore Operations (NSTec / LO) to determine temporal response and dynamic range, leading to diode shape and circuitry changes to optimize impedance and charge storage. We fielded individual and stacked systems at several national facilities as ancillary ‘ride-along’ diagnostics to test and improve the design usability. We present the MiniXRD system performance which supports consideration as a viable low-cost alternative for multiple-channel low-energy X-ray measurements. This diode array is currently at Technical Readiness Level (TRL) 6.