Dr. Eric C. Fest Profile

Dr. Eric C. Fest

Optical Scientist at Phobos Optics LLC

SPIE Involvement:

Author | Instructor | Special Event Speaker

Area of Expertise:

Stray light analysis , Stray light analysis , Scatter measurement and analysis , Polarization analysis , Infrared sensor engineering , Contamination analysis and control

Proceedings Article | 19 November 2021 Presentation + Paper

Proposed syllabus for augmented reality display waveguide design course

Eric Fest

Proceedings Volume 12078, 120780W (2021) https://doi.org/10.1117/12.2603641

KEYWORDS: Waveguides, Augmented reality, Diffraction gratings, Optical design, Diffraction, Eye, Projection systems, Modulation transfer functions, Virtual reality, Holography

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Proceedings Article | 8 September 2015 Paper

VIIRS/J1 polarization narrative

Eugene Waluschka, Joel McCorkel, Jeff McIntire, David Moyer, Brendan McAndrew, Steven Brown, Keith Lykke, James Young, Eric Fest, James Butler, Tung Wang, Eslim Monroy, Kevin Turpie, Gerhard Meister, Kurtis Thome

Proceedings Volume 9607, 960712 (2015) https://doi.org/10.1117/12.2190138

KEYWORDS: Polarization, Sensors, Polarizers, Optical filters, Calibration, Bandpass filters, Mirrors, Stray light, Radiometry, Integrating spheres

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Proceedings Article | 1 September 2015 Paper

On demand polarimetry using a movable microgrid polarizer

Page King, Eric Fest

Proceedings Volume 9613, 961306 (2015) https://doi.org/10.1117/12.2188705

KEYWORDS: Polarimetry, Calibration, Staring arrays, Polarizers, Optical filters, Linear polarizers, Camera shutters, Sensors, Polarization, Transmittance

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SPIE Press Book | 27 March 2013

Stray Light Analysis and Control

Eric Fest

KEYWORDS: Stray light, Ray tracing, Scattering, Sun, Stray light analysis, Mirrors, Reflectivity, Diffraction, Bidirectional reflectance transmission function

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Proceedings Article | 23 October 2012 Paper

Polarization sensitivity of Visible Infrared Imager Radiometer Suite (VIIRS) Flight Unit 1

Edward Novitsky, Stephen Herbst, James Young, Jeffery Puschell, Eric Fest, Bruce Guenther

Proceedings Volume 8516, 85160I (2012) https://doi.org/10.1117/12.2000151

KEYWORDS: Polarization, Sensors, Imaging systems, Radiometry, Signal detection, Mirrors, Polarizers, Visible radiation, Infrared imaging, Infrared radiation

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Proceedings Article | 17 September 2011 Paper

Staring MWIR, LWIR and 2-color and scanning LWIR polarimetry technology

Neil Malone, Adam Kennedy, Roger Graham, Yen Thai, Justin Stark, Joe Sienicki, Eric Fest

Proceedings Volume 8154, 81540T (2011) https://doi.org/10.1117/12.897345

KEYWORDS: Polarimetry, Long wavelength infrared, Sensors, Mid-IR, Polarization, Staring arrays, Polarizers, Optical filters, Reflectivity, Image fusion

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Proceedings Article | 21 May 2011 Paper

Anisotropy in structural and optical properties of chemical vapor deposited ZnS

John McCloy, Eric Fest, Ralph Korenstein, W. Howard Poisl

Proceedings Volume 8016, 80160I (2011) https://doi.org/10.1117/12.886138

KEYWORDS: Chemical vapor deposition, Zinc, Scattering, Absorption, FT-IR spectroscopy, Anisotropy, Infrared radiation, Optical properties, X-ray diffraction, Crystals

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Proceedings Article | 12 August 2009 Paper

VIIRS polarization sensitivity testing and analysis

Eric Fest

Proceedings Volume 7461, 746102 (2009) https://doi.org/10.1117/12.828154

KEYWORDS: Polarization, Sensors, Mirrors, Data modeling, Optical components, Coating, Ray tracing, Reflectivity, Thin films, Transmittance

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Proceedings Article | 2 September 2008 Paper

Data reduction of BSDF measurements from curved surfaces

Eric Fest

Proceedings Volume 7069, 70690K (2008) https://doi.org/10.1117/12.792570

KEYWORDS: Sensors, Mirrors, Device simulation, Instrument modeling, Monte Carlo methods, Statistical modeling, Data modeling, Ray tracing, Scatter measurement, Optical analysis

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Proceedings Article | 29 August 2008 Paper

Modeling scatter in composite media

Eric Fest

Proceedings Volume 7065, 70650B (2008) https://doi.org/10.1117/12.792572

KEYWORDS: Transmittance, Particles, Refractive index, Scattering, Composites, Principal component analysis, Data modeling, Ceramics, Optical spheres, Statistical modeling

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Proceedings Article | 7 September 2006 Paper

Improved Mie theory scatter model for particulate contamination that conserves energy and obeys reciprocity

David Jenkins, Eric Fest, Rex Kremer, Paul Spyak

Proceedings Volume 6291, 62910Q (2006) https://doi.org/10.1117/12.681173

KEYWORDS: Particles, Data modeling, Mirrors, Contamination, Atmospheric modeling, Mie scattering, Backscatter, Spherical lenses, Ray tracing, Reflectivity

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Proceedings Article | 5 September 2006 Paper

Robust error estimation in optical analysis software using subdivided and recombined ray traces

David Jenkins, Eric Fest

Proceedings Volume 6289, 62890O (2006) https://doi.org/10.1117/12.681187

KEYWORDS: Error analysis, Statistical analysis, Optical analysis, Monte Carlo methods, Computer simulations, Ray tracing, Sensors, Geometrical optics, Image analysis, Transmittance

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Proceedings Article | 4 September 2002 Paper

Error estimation and smoothing of 2D illumination and chromaticity distributions

William Cassarly, Eric Fest, David Jenkins

Proceedings Volume 4769, (2002) https://doi.org/10.1117/12.481178

KEYWORDS: Error analysis, Ray tracing, Monte Carlo methods, Nonlinear filtering, Roads, Image segmentation, RGB color model, Copper, Silver, Gold

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Proceedings Article | 26 September 2000 Paper

Modeling anisotropic scattering surfaces in illumination software

Eric Fest, David Jenkins

Proceedings Volume 4100, (2000) https://doi.org/10.1117/12.401661

KEYWORDS: Scattering, Data modeling, Light scattering, Laser scattering, Reflectors, Ray tracing, Palladium, Aluminum, Monte Carlo methods, Illumination software

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Proceedings Article | 27 September 1999 Paper

Interpolation methods using irregularly spaced coating performance data

Eric Fest

Proceedings Volume 3780, (1999) https://doi.org/10.1117/12.363765

KEYWORDS: Coating, Data modeling, Ray tracing, Reflectivity, Thin films, Transmittance, Dielectrics, YAG lasers, Chlorine, Thin film coatings

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Showing 5 of 15 publications

Course Instructor

SC1199: Stray Light Analysis and Control

This course explains the basic principles of designing, building, and testing optical systems whose stray light performance is adequate for their intended purpose. It teaches methods to identify stray light problems in the design phase when they can be most easily and inexpensively fixed, and does not emphasize the use of any particular stray light analysis software, but rather the fundamental principles of radiometry and optical design necessary to use such software effectively. Application of the course material is demonstrated in class by measuring the stray light performance of a simple camera system and comparing the measurement to both first order estimates and detailed ray tracing results.

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