Eric A. Flug
Electronics Engineer at US Army NVESD
SPIE Involvement:
Author
Publications (17)

PROCEEDINGS ARTICLE | June 24, 2016
Proc. SPIE. 9820, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII
KEYWORDS: Signal to noise ratio, Signal to noise ratio, Eye, Wavelet transforms, Imaging systems, Wavelets, Image quality, Target acquisition, Performance modeling, Targeting Task Performance metric, Targeting Task Performance metric, Received signal strength

PROCEEDINGS ARTICLE | May 3, 2016
Proc. SPIE. 9820, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII
KEYWORDS: Imaging systems, Cameras, Fourier transforms, Imaging devices, LCDs, Modulation transfer functions, Photometry, CRTs, Systems modeling, RGB color model

PROCEEDINGS ARTICLE | May 12, 2015
Proc. SPIE. 9452, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI
KEYWORDS: Visual process modeling, Imaging systems, Diagnostics, Image quality, LCDs, Optical resolution, Photometry, CRTs, Performance modeling, Systems modeling

PROCEEDINGS ARTICLE | June 24, 2014
Proc. SPIE. 9118, Independent Component Analyses, Compressive Sampling, Wavelets, Neural Net, Biosystems, and Nanoengineering XII
KEYWORDS: 3D acquisition, LIDAR, Image processing, Fourier transforms, Image acquisition, Iris, Phase retrieval, Target recognition, Target acquisition, 3D image processing

PROCEEDINGS ARTICLE | May 29, 2014
Proc. SPIE. 9071, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV
KEYWORDS: Target detection, Data modeling, Sensors, Calibration, Video, Palladium, Neodymium, Performance modeling, Systems modeling, NVThermIP

PROCEEDINGS ARTICLE | May 24, 2012
Proc. SPIE. 8355, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII
KEYWORDS: Target detection, Short wave infrared radiation, Weapons, Imaging systems, Target recognition, Target acquisition, Contrast transfer function, Performance modeling, Systems modeling, Targeting Task Performance metric

Showing 5 of 17 publications
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