Eric M. Frey
at 4D Technology Corp
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | August 18, 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Confocal microscopy, Modulation, Polarization, Interferometers, Cameras, Calibration, Wavefronts, Polarizers, Computer programming, Fizeau interferometers

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