Eric Maire
at INSA Lyon
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 September 2019
Proc. SPIE. 11113, Developments in X-Ray Tomography XII
KEYWORDS: Diffraction, Stereoscopy, Crystals, X-rays, Tomography, 3D metrology, Aluminum, Synchrotrons, Crystallography, 3D image processing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top