KEYWORDS: Spectroscopy, Digital Light Processing, Digital micromirror devices, Near infrared, Detector arrays, Sensors, Optical filters, Signal to noise ratio, Lamps, Spectral resolution, Reflectivity
The DLP NIRscan Nano is an ultra-portable spectrometer evaluation module utilizing DLP technology to meet lower cost, smaller size, and higher performance than traditional architectures. The replacement of a linear array detector with DLP digital micromirror device (DMD) in conjunction with a single point detector adds the functionality of programmable spectral filters and sampling techniques that were not previously available on NIR spectrometers. This paper presents the hardware, software, and optical systems of the DLP NIRscan Nano and its design considerations on the implementation of a DLP-based spectrometer.
KEYWORDS: Spectrometers, Sensors, Digital micromirror devices, Digital Light Processing, Optical filters, Near infrared, Mirrors, Signal detection, Humidity, Signal to noise ratio
Designing the next generation of embedded compact, portable near-infrared (NIR) spectrometers while meeting aggressive cost and form factor targets requires novel technologies and creative system designs. New miniature spectrometer architectures are enabled by Texas Instruments DLP® technology. The ability to provide programmable spectral filters using high speed, accurate light modulation with a micro-electro mechanical systems (MEMS) based architecture enables systems with features and sampling techniques that were previously not possible. System design considerations and the latest developments in DLP spectrometer architectures will be presented.
KEYWORDS: Spectroscopy, Sensors, Digital Light Processing, Absorbance, Digital micromirror devices, Spectroscopes, Signal detection, Near infrared, Manufacturing, Detector arrays
The architecture of a Texas Instruments DLP spectrometer allows techniques of spectrum measurement through programmable patterns previously not possible by conventional spectrometers. Handheld applications or factory settings measuring dynamic product flow may have constraints on sampling methods which vary the amount of illumination entering the spectrometer. Factory monitoring and other in situ applications may have a priori knowledge of expected substances or contaminants and have stringent sampling speed requirements. By defining custom scan patterns and decoding techniques to take advantage of this information, we show that classic time-domain challenges of time-multiplexed sensing systems can be overcome in a DLP spectrometer yielding high performance in challenging applications.
Conference Committee Involvement (5)
Emerging Digital Micromirror Device Based Systems and Applications XVII
25 January 2025 | San Francisco, California, United States
Emerging Digital Micromirror Device Based Systems and Applications XVI
30 January 2024 | San Francisco, California, United States
Emerging Digital Micromirror Device Based Systems and Applications XV
30 January 2023 | San Francisco, California, United States
Emerging Digital Micromirror Device Based Systems and Applications XIV
25 January 2022 | San Francisco, California, United States
Emerging Digital Micromirror Device Based Systems and Applications XIII
6 March 2021 | Online Only, California, United States
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