Dr. Eric Wille
at European Space Research and Technology Ctr
SPIE Involvement:
Author
Publications (50)

PROCEEDINGS ARTICLE | October 13, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: Mirrors, Silicon, Annealing, X-ray optics, Failure analysis, Space telescopes, X-rays, Space mirrors, Multilayers, Climatology

PROCEEDINGS ARTICLE | September 25, 2017
Proc. SPIE. 10562, International Conference on Space Optics 2016
KEYWORDS: Optical communications, Robotics, Control systems, Telecommunications, Space telescopes, Telescopes, Data communications, Astronomical imaging, Video, Lanthanum

PROCEEDINGS ARTICLE | September 21, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: Optics manufacturing, Metrology, Silicon, Geometrical optics, X-ray optics, Monte Carlo methods, Ray tracing, Performance modeling, X-rays, Standards development

PROCEEDINGS ARTICLE | September 19, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: Mirrors, Optical alignment, Silicon, Device simulation, Spatial resolution, Optical design, X-ray telescopes, Wafer-level optics, Diffraction, X-rays

PROCEEDINGS ARTICLE | September 8, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: X-rays, X-ray optics, Optics manufacturing, Metrology, Silicon, Sensors, X-ray characterization, X-ray detectors, Geometrical optics, Algorithm development

PROCEEDINGS ARTICLE | August 29, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: Mirrors, X-ray optics, Silicon, Optics manufacturing, Wafer-level optics, X-ray astronomy, Semiconducting wafers, Astronomical imaging, X-ray telescopes, Spatial resolution

Showing 5 of 50 publications
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