Dr. Erik R. Deutsch
SPIE Involvement:
Author
Publications (11)

Proceedings Article | 14 May 2018 Presentation + Paper
Proceedings Volume 10657, 106570N (2018) https://doi.org/10.1117/12.2304374
KEYWORDS: Spectrometers, Raman spectroscopy, Hyperspectral imaging, Imaging systems, Sensors, Image resolution, Collimation, Spectral resolution, Reflectivity, Diffraction gratings

Proceedings Article | 13 February 2018 Paper
Proceedings Volume 10490, 104900T (2018) https://doi.org/10.1117/12.2302731
KEYWORDS: Raman spectroscopy, Spectral resolution, Spectrometers, Sensors, Imaging spectroscopy, Particles, Imaging systems, Photons, Dispersion, Signal to noise ratio

Proceedings Article | 9 June 2017 Paper
Proceedings Volume 10210, 102100E (2017) https://doi.org/10.1117/12.2279886
KEYWORDS: Raman spectroscopy, Spectroscopy, Imaging spectroscopy, Sensors, Spectral resolution, Hyperspectral imaging, Image sensors, Signal to noise ratio, CMOS sensors, Imaging systems

Proceedings Article | 10 June 2015 Paper
Petros Kotidis, Erik Deutsch, Anish Goyal
Proceedings Volume 9467, 94672S (2015) https://doi.org/10.1117/12.2178169
KEYWORDS: Standoff detection, Quantum cascade lasers, Biological detection systems, Toxic industrial chemicals, Chemical analysis, Sensors, Mid-IR, Control systems, Nerve

Proceedings Article | 22 May 2015 Paper
Anish Goyal, Petros Kotidis, Erik Deutsch, Ninghui Zhu, Mark Norman, Jim Ye, Kostas Zafiriou, Alexander Mazurenko
Proceedings Volume 9455, 94550L (2015) https://doi.org/10.1117/12.2177527
KEYWORDS: Clouds, Quantum cascade lasers, Gases, Atmospheric sensing, Retroreflectors, Spectroscopy, Laser systems engineering, Long wavelength infrared, Sensors, Absorption

Showing 5 of 11 publications
Conference Committee Involvement (2)
Next-Generation Spectroscopic Technologies IV
25 April 2011 | Orlando, Florida, United States
Next-Generation Spectroscopic Technologies III
5 April 2010 | Orlando, Florida, United States
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