Erik Krempel
at Fraunhofer IOSB
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 September 2020 Presentation + Paper
Arno Appenzeller, Erik Krempel, Pascal Birnstill, Jürgen Beyerer
Proceedings Volume 11542, 1154207 (2020) https://doi.org/10.1117/12.2570824
KEYWORDS: Computer security, Information security, Data modeling, Plasma display panels, Instrument modeling, Control systems, Systems modeling, Solid modeling, Environmental sensing

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