Dr. Erik Novak
Director of Business Development at 4D Technology Corp
SPIE Involvement:
Senior status | Conference Chair | Conference Program Committee | Author | Editor
Publications (37)

SPIE Journal Paper | September 8, 2017
OE Vol. 56 Issue 11
KEYWORDS: Interferometry, Metrology, Optical engineering, Interferometers, Optics manufacturing, Microscopy, Distance measurement, Physics, Optical fabrication, Speckle

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Inspection, Optical metrology, Metrology, Interferometry, Optical inspection, Visualization, 3D metrology, In situ metrology, Image resolution, Optical resolution

SPIE Conference Volume | September 10, 2015

PROCEEDINGS ARTICLE | September 3, 2015
Proc. SPIE. 9576, Applied Advanced Optical Metrology Solutions
KEYWORDS: Metrology, Flexible circuits, 3D metrology, Interferometry, Cameras, Manufacturing, Inspection, Reflection, Surface roughness, Interferometers

PROCEEDINGS ARTICLE | August 18, 2014
Proc. SPIE. 9204, Interferometry XVII: Advanced Applications
KEYWORDS: Calibration, Interferometry, Wavefronts, Interferometers, Environmental sensing, Spherical lenses, Optical spheres, Zernike polynomials, Optical testing, Precision measurement

SPIE Conference Volume | July 16, 2014

Showing 5 of 37 publications
Conference Committee Involvement (16)
Applied Optical Metrology II
8 August 2017 | San Diego, California, United States
Interferometry XVIII
30 August 2016 | San Diego, California, United States
Applied Advanced Optical Metrology Solutions
11 August 2015 | San Diego, California, United States
Interferometry XVII: Advanced Applications
19 August 2014 | San Diego, California, United States
Interferometry XVI: Applications
14 August 2012 | San Diego, California, United States
Showing 5 of 16 published special sections
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