Dr. Erik Novak
Director of Business Development at 4D Technology Corp
SPIE Involvement:
Fellow status | Senior status | Conference Chair | Conference Program Committee | Editor | Author
Publications (38)

SPIE Conference Volume | December 11, 2017

SPIE Journal Paper | September 8, 2017
OE Vol. 56 Issue 11
KEYWORDS: Interferometry, Metrology, Optical engineering, Interferometers, Optics manufacturing, Microscopy, Distance measurement, Physics, Optical fabrication, Speckle

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Metrology, Visualization, In situ metrology, Inspection, Image resolution, Interferometry, Optical inspection, Optical metrology, 3D metrology, Optical resolution

SPIE Conference Volume | September 10, 2015

PROCEEDINGS ARTICLE | September 3, 2015
Proc. SPIE. 9576, Applied Advanced Optical Metrology Solutions
KEYWORDS: Metrology, Reflection, Interferometers, Cameras, Manufacturing, Inspection, Surface roughness, Interferometry, 3D metrology, Flexible circuits

PROCEEDINGS ARTICLE | August 18, 2014
Proc. SPIE. 9204, Interferometry XVII: Advanced Applications
KEYWORDS: Optical spheres, Interferometers, Calibration, Interferometry, Wavefronts, Optical testing, Zernike polynomials, Precision measurement, Spherical lenses, Environmental sensing

Showing 5 of 38 publications
Conference Committee Involvement (16)
Applied Optical Metrology II
8 August 2017 | San Diego, California, United States
Interferometry XVIII
30 August 2016 | San Diego, California, United States
Applied Advanced Optical Metrology Solutions
11 August 2015 | San Diego, California, United States
Interferometry XVII: Advanced Applications
19 August 2014 | San Diego, California, United States
Interferometry XVI: Applications
14 August 2012 | San Diego, California, United States
Showing 5 of 16 published special sections
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