Dr. Erik Novak
Director of Business Development at 4D Technology Corp
SPIE Involvement:
Fellow status | Senior status | Conference Chair | Conference Program Committee | Author | Editor
Publications (40)

PROCEEDINGS ARTICLE | September 7, 2018
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Fringe analysis, Polarization, Inspection, Interferometry, 3D metrology, Structured light

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Mirrors, Aerospace engineering, Polarization, Metals, Inspection, Additive manufacturing, 3D metrology, Spatial resolution, Phase shifts, Structured light

SPIE Conference Volume | December 11, 2017

SPIE Journal Paper | September 8, 2017
OE Vol. 56 Issue 11
KEYWORDS: Interferometry, Metrology, Optical engineering, Interferometers, Optics manufacturing, Microscopy, Distance measurement, Physics, Optical fabrication, Speckle

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Metrology, Visualization, In situ metrology, Inspection, Image resolution, Interferometry, Optical inspection, Optical metrology, 3D metrology, Optical resolution

SPIE Conference Volume | September 10, 2015

Showing 5 of 40 publications
Conference Committee Involvement (17)
Applied Optical Metrology III
11 August 2019 | San Diego, California, United States
Applied Optical Metrology II
8 August 2017 | San Diego, California, United States
Interferometry XVIII
30 August 2016 | San Diego, California, United States
Applied Advanced Optical Metrology Solutions
11 August 2015 | San Diego, California, United States
Interferometry XVII: Advanced Applications
19 August 2014 | San Diego, California, United States
Showing 5 of 17 published special sections
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