Dr. Erik Novak
Sr. Director, Business Development at 4D Technology Corp
SPIE Involvement:
Editor | Author
Publications (31)

Proceedings Article | 3 September 2019
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Fringe analysis, Polarization, Visualization, Imaging systems, Cameras, Interferometry, Polarizers, 3D metrology, Projection systems, Structured light

Proceedings Article | 7 September 2018
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Fringe analysis, Polarization, Inspection, Interferometry, 3D metrology, Structured light

Proceedings Article | 14 May 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Mirrors, Aerospace engineering, Polarization, Metals, Inspection, Additive manufacturing, 3D metrology, Spatial resolution, Phase shifts, Structured light

SPIE Journal Paper | 8 September 2017
OE Vol. 56 Issue 11
KEYWORDS: Interferometry, Metrology, Optical engineering, Interferometers, Optics manufacturing, Microscopy, Distance measurement, Physics, Optical fabrication, Speckle

Proceedings Article | 23 August 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Metrology, Visualization, In situ metrology, Inspection, Image resolution, Interferometry, Optical inspection, Optical metrology, 3D metrology, Optical resolution

Showing 5 of 31 publications
Proceedings Volume Editor (11)

SPIE Conference Volume | 4 November 2019

SPIE Conference Volume | 11 December 2017

SPIE Conference Volume | 10 September 2015

SPIE Conference Volume | 16 July 2014

SPIE Conference Volume | 13 September 2012

Showing 5 of 11 publications
Conference Committee Involvement (17)
Applied Optical Metrology III
13 August 2019 | San Diego, California, United States
Applied Optical Metrology II
8 August 2017 | San Diego, California, United States
Interferometry XVIII
30 August 2016 | San Diego, California, United States
Applied Advanced Optical Metrology Solutions
11 August 2015 | San Diego, California, United States
Interferometry XVII: Advanced Applications
19 August 2014 | San Diego, California, United States
Showing 5 of 17 Conference Committees
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