Erik Sparrer
at Technische Univ Ilmenau
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 13 May 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Detection and tracking algorithms, Visualization, Sensors, Calibration, Image processing, Image filtering, Zoom lenses, Data conversion, Binary data, Blob detection

Proceedings Article | 13 May 2011
Proc. SPIE. 8031, Micro- and Nanotechnology Sensors, Systems, and Applications III
KEYWORDS: Human-machine interfaces, MATLAB, Metrology, Sensors, Calibration, Inspection, Computer programming, Data processing, Measurement devices, Computer architecture

Proceedings Article | 22 May 2009
Proc. SPIE. 7378, Scanning Microscopy 2009
KEYWORDS: Microscopes, Point spread functions, Data modeling, Image processing, Microscopy, Deconvolution, Convolution, Scanning probe microscopy, Analytical research, Chemical elements

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