Prof. Erik W. Stijns
at Vrije Univ Brussel
SPIE Involvement:
Publications (16)

Proceedings Article | 26 September 2013 Paper
Proc. SPIE. 8856, Applications of Digital Image Processing XXXVI
KEYWORDS: Beam splitters, Holograms, Holography, Independent component analysis, Image compression, Digital holography, Wavelets, Discrete wavelet transforms, Microlens, Digital recording

Proceedings Article | 14 May 2010 Paper
Proc. SPIE. 7718, Optical Micro- and Nanometrology III
KEYWORDS: Modeling, Polishing, Reflection, Scattering, Polymers, Metals, Interfaces, Light scattering, Coating, Reflectivity

Proceedings Article | 17 June 2009 Paper
Proc. SPIE. 7390, Modeling Aspects in Optical Metrology II
KEYWORDS: Oxides, Ellipsometry, Visualization, Reflection, Optical coatings, Reflectivity, Scatterometry, Hematite, Scatter measurement, Statistical modeling

Proceedings Article | 1 May 2008 Paper
Proc. SPIE. 6995, Optical Micro- and Nanometrology in Microsystems Technology II
KEYWORDS: Reflection, Spatial frequencies, Scattering, Polymers, Light scattering, Interferometry, Atomic force microscopy, Scatterometry, Scatter measurement, Surface finishing

Proceedings Article | 3 June 2007 Paper
Proc. SPIE. 9665, Tenth International Topical Meeting on Education and Training in Optics and Photonics
KEYWORDS: Optical components, Diffractive optical elements, Image processing, Image acquisition, Computer simulations, Semiconductor lasers, Photonics, Micro optics, Optical simulations, Compact discs

Showing 5 of 16 publications
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