Erik Stover
CEO at TRIOPTICS USA
SPIE Involvement:
Conference Program Committee | Author
Publications (7)

Proceedings Article | 19 June 2019 Presentation + Paper
Proc. SPIE. 10998, Advanced Optics for Imaging Applications: UV through LWIR IV
KEYWORDS: Infrared imaging, Zemax, Refractive index, Data modeling, Sensors, Glasses, Data acquisition, Infrared radiation, Thermal modeling, Temperature metrology

Proceedings Article | 24 August 2017 Presentation + Paper
Proc. SPIE. 10181, Advanced Optics for Defense Applications: UV through LWIR II
KEYWORDS: Oxides, Thermography, Infrared imaging, Chalcogenide glass, Cameras, Sensors, Glasses, Image sensors, Infrared radiation, Precision glass molding

Proceedings Article | 20 September 2016 Presentation + Paper
Proc. SPIE. 9974, Infrared Sensors, Devices, and Applications VI
KEYWORDS: Refractive index, Mirrors, Optical design, Prisms, Calibration, Germanium, Refraction, Monochromators, Refractometry, Temperature metrology

Proceedings Article | 17 May 2016 Paper
Proc. SPIE. 9822, Advanced Optics for Defense Applications: UV through LWIR
KEYWORDS: Oxides, Chalcogenide glass, Refractive index, Lenses, Glasses, Annealing, Manufacturing, Neodymium, Precision glass molding, Glass molding

Proceedings Article | 11 October 2015 Paper
Proc. SPIE. 9633, Optifab 2015
KEYWORDS: Monochromatic aberrations, Metrology, Interferometers, Sensors, Error analysis, Optical testing, Distance measurement, Aspheric optics, 3D metrology, Aspheric lenses

Showing 5 of 7 publications
Conference Committee Involvement (1)
Optifab 2021
18 October 2021 | Rochester, New York, United States
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