Prof. Erkki Oja
at Aalto Univ School of Science and Technology
SPIE Involvement:
Conference Program Committee | Conference Co-Chair | Author | Instructor
Publications (3)

Proceedings Article | 12 April 2004
Proc. SPIE. 5439, Independent Component Analyses, Wavelets, Unsupervised Smart Sensors, and Neural Networks II
KEYWORDS: Principal component analysis, Independent component analysis, Statistical analysis, Data modeling, Neural networks

Conference Committee Involvement (9)
Independent Component Analyses, Wavelets, Neural Networks, Biosystems, and Nanoengineering VIII
7 April 2010 | Orlando, Florida, United States
Independent Component Analyses, Wavelets, Neural Networks, Biosystems, and Nanoengineering VII
13 April 2009 | Orlando, Florida, United States
Independent Component Analyses, Wavelets, Unsupervised Nano-Biomimetic Sensors and Neural Networks VI
17 March 2008 | Orlando, Florida, United States
Independent Component Analyses, Wavelets, Unsupervised Nano-Biomimetic Sensors and Neural Networks V
10 April 2007 | Orlando, Florida, United States
Independent Component Analyses, Wavelets, Unsupervised Smart Sensors, and Neural Networks IV
19 April 2006 | Orlando (Kissimmee), Florida, United States
Showing 5 of 9 published special sections
Course Instructor
SC638: Independent Component Analysis: Theory and Applications
The course covers the basic principles and approaches to independent component analysis, concentrating on fast algorithms for separating a number of source signals from their instantaneous mixtures. Sound separation will not be included. Connections to unsupervised learning in neural networks will be pointed out. Some applications will be covered in detail: extraction of meaningful signals from biomedical measurements, as well as finding hidden factors from text documents.
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