Dr. Ernst Bodenstorfer
at AIT Austrian Institute of Technology GmbH
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 22 June 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Sensors, Cadmium sulfide, Cameras, Inspection, Line scan image sensors, Image sensors, RGB color model, Synthetic aperture radar, Signal to noise ratio, Optical filters

Proceedings Article | 14 February 2015
Proc. SPIE. 9445, Seventh International Conference on Machine Vision (ICMV 2014)
KEYWORDS: Digital signal processing, Field programmable gate arrays, Image processing, Cameras, Clocks, Inspection, Optical inspection, Signal processing, Image resolution, Interfaces

Proceedings Article | 26 February 2007
Proc. SPIE. 6496, Real-Time Image Processing 2007
KEYWORDS: Cameras, Sensors, CMOS sensors, Line scan image sensors, Field programmable gate arrays, Image sensors, Imaging systems, CCD image sensors, High speed cameras, Optical filters

Proceedings Article | 17 February 2007
Proc. SPIE. 6503, Machine Vision Applications in Industrial Inspection XV
KEYWORDS: Cameras, Inspection, Image processing, Field programmable gate arrays, Sensors, Imaging systems, Image resolution, Feature extraction, RGB color model, Digital signal processing

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