Esmaeil Heidari
Biomedical/Optical Engineer at GE Global Research
SPIE Involvement:
Publications (6)

Proc. SPIE. 9960, Interferometry XVIII
KEYWORDS: Moire patterns, Fringe analysis, Visualization, Cameras, Solar cells, Manufacturing, Deflectometry, 3D metrology, Optical alignment, Neodymium

PROCEEDINGS ARTICLE | September 20, 2013
Proc. SPIE. 8839, Dimensional Optical Metrology and Inspection for Practical Applications II
KEYWORDS: Confocal microscopy, Metrology, Imaging systems, Sensors, Surface roughness, Colorimetry, Motion measurement, Radium, Surface finishing, Edge roughness

PROCEEDINGS ARTICLE | February 19, 2013
Proc. SPIE. 8659, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIV
KEYWORDS: 3D image reconstruction, Imaging systems, Cameras, Image resolution, Lens design, 3D modeling, 3D metrology, Modulation transfer functions, 3D image processing, Structured light

PROCEEDINGS ARTICLE | November 20, 2012
Proc. SPIE. 8563, Optical Metrology and Inspection for Industrial Applications II
KEYWORDS: Confocal microscopy, Imaging systems, Calibration, Light scattering, Manufacturing, Laser scattering, Surface roughness, Colorimetry, Optical interferometry, Surface finishing

PROCEEDINGS ARTICLE | September 14, 2011
Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications
KEYWORDS: Infrared imaging, Sensors, Crystals, Ions, Inspection, Wafer inspection, Associative arrays, Neodymium, Semiconducting wafers, 3D image processing

PROCEEDINGS ARTICLE | February 18, 2011
Proc. SPIE. 7883, Photonic Therapeutics and Diagnostics VII
KEYWORDS: Optical imaging, Coherence imaging, Visualization, Optical coherence tomography, Image segmentation, Pathology, Image resolution, Arteries, In vivo imaging, Tissue optics

Showing 5 of 6 publications
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