Dr. Eugenio Rafael Mendez Mendez
at CICESE
SPIE Involvement:
Conference Chair | Conference Program Committee | Author | Editor
Publications (37)

PROCEEDINGS ARTICLE | November 9, 2016
Proc. SPIE. 9921, Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XIV
KEYWORDS: Gold, Plasmonics, Nanostructures, Optical properties, Nanoparticles, Particles, Silver, Numerical analysis, Spherical lenses, Resonance enhancement

PROCEEDINGS ARTICLE | September 26, 2016
Proc. SPIE. 9961, Reflection, Scattering, and Diffraction from Surfaces V
KEYWORDS: Gold, Scattering, Metals, Light scattering, Laser scattering, Numerical simulations, Computer simulations, System on a chip, Americium, Correlation function

SPIE Conference Volume | August 24, 2015

PROCEEDINGS ARTICLE | September 2, 2010
Proc. SPIE. 7792, Reflection, Scattering, and Diffraction from Surfaces II
KEYWORDS: Scattering, Laser applications, Laser scattering, Astronomical imaging, Atmospheric propagation, Laser optics, Beam propagation method, Electromagnetism, Electromagnetic scattering, Radio propagation

PROCEEDINGS ARTICLE | September 10, 2007
Proc. SPIE. 6672, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
KEYWORDS: Gaussian beams, Speckle, Scattering, Glasses, Light scattering, Laser scattering, Gaussian filters, Spatial coherence, Charge-coupled devices, Feedback loops

PROCEEDINGS ARTICLE | September 10, 2007
Proc. SPIE. 6672, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
KEYWORDS: Mirrors, Retroreflectors, Backscatter, Reflection, Scattering, Dielectrics, Interfaces, Light scattering, Physics, Structural design

Showing 5 of 37 publications
Conference Committee Involvement (8)
SPECKLE 2015: VI International Conference on Speckle Metrology
24 August 2015 | Guanajuato, Mexico
Optical Complex Systems: OCS11
5 September 2011 | Marseille, France
Reflection, Scattering, and Diffraction from Surfaces II
2 August 2010 | San Diego, California, United States
Reflection, Scattering, and Diffraction from Surfaces
11 August 2008 | San Diego, California, United States
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
28 August 2007 | San Diego, California, United States
Showing 5 of 8 published special sections
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