Dr. Eugenio R. Mendez
at CICESE
SPIE Involvement:
Conference Chair | Conference Program Committee | Author | Editor
Publications (36)

PROCEEDINGS ARTICLE | September 26, 2016
Proc. SPIE. 9961, Reflection, Scattering, and Diffraction from Surfaces V
KEYWORDS: Gold, Scattering, Metals, Light scattering, Laser scattering, Numerical simulations, Computer simulations, System on a chip, Americium, Correlation function

SPIE Conference Volume | August 24, 2015

PROCEEDINGS ARTICLE | September 2, 2010
Proc. SPIE. 7792, Reflection, Scattering, and Diffraction from Surfaces II
KEYWORDS: Scattering, Laser applications, Laser scattering, Astronomical imaging, Atmospheric propagation, Laser optics, Beam propagation method, Electromagnetism, Electromagnetic scattering, Radio propagation

PROCEEDINGS ARTICLE | September 10, 2007
Proc. SPIE. 6672, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
KEYWORDS: Gaussian beams, Speckle, Scattering, Glasses, Light scattering, Laser scattering, Gaussian filters, Spatial coherence, Charge-coupled devices, Feedback loops

PROCEEDINGS ARTICLE | September 10, 2007
Proc. SPIE. 6672, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
KEYWORDS: Mirrors, Retroreflectors, Backscatter, Reflection, Scattering, Dielectrics, Interfaces, Light scattering, Physics, Structural design

PROCEEDINGS ARTICLE | August 19, 2005
Proc. SPIE. 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
KEYWORDS: Superposition, Mirrors, Beam splitters, Mach-Zehnder interferometers, Interferometers, Glasses, Free space, Laser beam propagation, Collimation, Michelson interferometers

Showing 5 of 36 publications
Conference Committee Involvement (8)
SPECKLE 2015: VI International Conference on Speckle Metrology
24 August 2015 | Guanajuato, Mexico
Optical Complex Systems: OCS11
5 September 2011 | Marseille, France
Reflection, Scattering, and Diffraction from Surfaces II
2 August 2010 | San Diego, California, United States
Reflection, Scattering, and Diffraction from Surfaces
11 August 2008 | San Diego, California, United States
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
28 August 2007 | San Diego, California, United States
Showing 5 of 8 published special sections
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