Evan M. Prast
Thin Film Engineering Manager at Research Electro-Optics Inc
SPIE Involvement:
Author
Publications (3)

SPIE Journal Paper | September 6, 2013
OE Vol. 52 Issue 09
KEYWORDS: Mirrors, Extreme ultraviolet, Reflectivity, Multilayers, Imaging systems, Ultraviolet radiation, Optical coatings, EUV optics, Spatial frequencies, Optical engineering

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8501, Advances in Metrology for X-Ray and EUV Optics IV
KEYWORDS: Telescopes, Mirrors, Multilayers, Spatial frequencies, Calibration, Optical coatings, Reflectivity, Space telescopes, Extreme ultraviolet, EUV optics

PROCEEDINGS ARTICLE | July 29, 2010
Proc. SPIE. 7732, Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray
KEYWORDS: Point spread functions, Telescopes, Mirrors, Multilayers, Metrology, Scattering, Light scattering, Bidirectional reflectance transmission function, Extreme ultraviolet, Charge-coupled devices

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