Prof. Félix Salazar-Bloise
at Univ Politécnica de Madrid
SPIE Involvement:
Conference Program Committee | Author
Publications (1)

Proceedings Article | 26 June 2017
Proc. SPIE. 10334, Automated Visual Inspection and Machine Vision II
KEYWORDS: Diffraction, Fringe analysis, Modulation, Inspection, Interferometry, Wavefronts, Modulators, Spatial light modulators, Liquid crystals, Phase shifts

Conference Committee Involvement (4)
Automated Visual Inspection and Machine Vision III
27 June 2019 | Munich, Germany
Automated Visual Inspection and Machine Vision
29 June 2017 | Munich, Germany
Automated Visual Inspection and Machine Vision
24 June 2015 | Munich, Germany
Automated Visual Inspection
16 May 2013 | Munich, Germany
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