Fabian Saso
at Synopsys Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 September 2019 Paper
Proceedings Volume 11148, 111481K (2019) https://doi.org/10.1117/12.2538626
KEYWORDS: Process modeling, Manufacturing, Algorithm development, Software development, Photomasks, Optical proximity correction, Time metrology

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