Dr. Fabian W. Strong
Sr Process Engineer at View Inc
SPIE Involvement:
Author
Area of Expertise:
Electrical Breakdown , MEMS , Photovoltaics , Process Development
Websites:
Publications (2)

SPIE Journal Paper | October 1, 2008
JM3 Vol. 7 Issue 04
KEYWORDS: Actuators, Switches, Head, Microelectromechanical systems, Oxides, Etching, Chemical elements, 3D modeling, Silicon, Resistance

PROCEEDINGS ARTICLE | January 6, 2006
Proc. SPIE. 6111, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V
KEYWORDS: Microelectromechanical systems, Actuators, Gold, Thin films, Switches, Electrodes, Metals, Electrons, Head, Electrical breakdown

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