Dr. Fabien Massabuau
at Univ of Cambridge
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 23, 2018
Proc. SPIE. 10532, Gallium Nitride Materials and Devices XIII
KEYWORDS: Microscopes, Optical properties, Atomic force microscopy, Scanning electron microscopy, Transmission electron microscopy, Indium gallium nitride, Defect inspection

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