Fabrice Guigues
at ISEN
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 January 2006
Proc. SPIE. 6035, Microelectronics: Design, Technology, and Packaging II
KEYWORDS: Scattering, Silicon, Doping, Microelectronics, Mathematics, Transistors, Analog electronics, Molybdenum, Standards development, Reverse modeling

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