Dr. Fabrice R. Michel Profile

Dr. Fabrice R. Michel

at AMOS Ltd

SPIE Involvement:

Author

Publications (13)

Proceedings Article | 12 July 2019

Full-SiC derotator optics for METimage: preliminary design and verification approach

E. Renotte, C. Bastin, F. Bernard, A. Bernat, JM. Boitrel, M. Bougoin, C. Flebus, E. Gillain, P. Gloesener, A. Jago, G. Laffitte, F. Lemagne, D. Logut, F. Mallet, A. Mazzoli, F. Michel, M. Pfaffe, M. Pinel, J. -M. Schumacher, F. Wolfs

Proc. SPIE. 11180, International Conference on Space Optics — ICSO 2018

KEYWORDS: Defense and security, Thermography, Mirrors, Coating, Chemical vapor deposition, Integrated optics, Optical alignment, Silicon carbide, Geometrical optics, Optics manufacturing

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SPIE Journal Paper | 9 August 2013

Combining shearography and interferometric fringe projection in a single device for complete control of industrial applications

Pascal Blain, Fabrice Michel, Pierre Piron, Yvon Renotte, Serge Habraken

OE Vol. 52 Issue 08

KEYWORDS: Shearography, Polarization, Interferometers, Interferometry, CCD cameras, Coating, Wave plates, Optical testing, Phase shifts, Control systems

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Proceedings Article | 17 September 2012 Paper

The 3,6 m Indo-Belgian Devasthal Optical Telescope: assembly, integration and tests at AMOS

Nathalie Ninane, Christian Bastin, Jonathan de Ville, Fabrice Michel, Maxime Pierard, Eric Gabriel, Carlo Flebus, Amitesh Omar

Proc. SPIE. 8444, Ground-based and Airborne Telescopes IV

KEYWORDS: Monochromatic aberrations, Telescopes, Mirrors, Stars, Wavefronts, Optical fabrication, Image quality, Optical telescopes, Optical instrument design, Active optics

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Proceedings Article | 28 April 2012 Paper

Carrier and aberrations removal in interferometric fringe projection profilometry

P. Blain, F. Michel, Y. Renotte, S. Habraken

Proc. SPIE. 8430, Optical Micro- and Nanometrology IV

KEYWORDS: Monochromatic aberrations, Fringe analysis, Cameras, Calibration, Interferometry, Wavefronts, Zernike polynomials, Projection systems, Phase measurement, Geometrical optics

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SPIE Journal Paper | 6 April 2012

Measurement of the defect size by shearography or other interferometric techniques

Fabrice Michel, Yvon Renotte, Serge Habraken

OE Vol. 51 Issue 03

KEYWORDS: Wavelets, Shearography, Interferometry, Wavelet transforms, Error analysis, Nondestructive evaluation, Optical engineering, Defect detection, Algorithm development, Interferometers

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Proceedings Article | 2 August 2010 Paper

Using a Savart plate in optical metrology

P. Blain, F. Michel, Y. Renotte, S. Habraken

Proc. SPIE. 7791, Interferometry XV: Applications

KEYWORDS: Defect detection, Polarization, Interferometers, Interferometry, Optical testing, CCD cameras, Projection systems, Light sources and illumination, Shearography, Structured light

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Proceedings Article | 18 May 2010 Paper

Comparison of spectral colorimetric measurements vs. color pictures in dermatology

P. Blain, F. Michel, V, Moreau, O. Vanhooteghem, Y. Renotte, S. Habraken

Proc. SPIE. 7715, Biophotonics: Photonic Solutions for Better Health Care II

KEYWORDS: Light sources, 3D acquisition, Cameras, Sensors, Calibration, Dermatology, Reflectivity, Interferometry, 3D modeling, RGB color model

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Proceedings Article | 5 August 2009 Paper

Nondestructive testing by digital shearography using a Savart plate

F. Michel, P. Blain, E. Auger, Y. Renotte, S. Habraken

Proc. SPIE. 7386, Photonics North 2009

KEYWORDS: Linear polarizers, Prisms, Polarization, Interferometers, Crystals, Nondestructive evaluation, Shearography, Geometrical optics, Optics manufacturing, Phase shifts

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SPIE Journal Paper | 1 October 2007

Almost-common path interferometer using the separation of polarization states for digital phase-shifting shearography

Vanessa Rosso, Yvon Renotte, Serge Habraken, Yves Lion, Fabrice Michel, Vincent Moreau, Bernard Tilkens

OE Vol. 46 Issue 10

KEYWORDS: Interferometers, Prisms, Glasses, Shearography, Wave plates, Polarization, Phase shifts, Liquid crystals, Coating, Modulators

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Proceedings Article | 18 June 2007 Paper

Quantification of defect size in shearing direction by shearography and wavelet transform

Fabrice Michel, Vincent Moreau, Vanessa Rosso, Serge Habraken, Bernard Tilkens

Proc. SPIE. 6616, Optical Measurement Systems for Industrial Inspection V

KEYWORDS: Wavelet transforms, Defect detection, Interferometers, Wavelets, Interferometry, Nondestructive evaluation, Speckle interferometry, Infrared radiation, Shearography, Phase shifts

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Proceedings Article | 15 September 2006 Paper

An almost-common path shearographic interferometer using the separation of the polarization states

Vanessa Rosso, Fabrice Michel, Vincent Moreau, Yvon Renotte, Bernard Tilkens, Yves Lion

Proc. SPIE. 6341, Speckle06: Speckles, From Grains to Flowers

KEYWORDS: Prisms, Polarization, Interferometers, Glasses, Coating, Wave plates, Modulators, Liquid crystals, Shearography, Phase shifts

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Proceedings Article | 8 September 2006 Paper

Out-of-plane displacement derivative measurement: comparison of results obtained by a shearographic interferometer using the separation of the polarization states and the finite element method

Vanessa Rosso, Lihong Zhang, Fabrice Michel, Yvon Renotte, Yves Lion, Anne-Marie Habraken

Proc. SPIE. 6343, Photonics North 2006

KEYWORDS: Prisms, Polarization, Interferometers, Glasses, Coating, Wave plates, Liquid crystals, Finite element methods, Shearography, Phase shifts

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Proceedings Article | 14 October 2005 Paper

Highlighting properties of filters for their application in temporal phase shifting interferometry

Vanessa Rosso, Fabrice Michel, Vincent Moreau, Yvon Renotte, Bernard Tilkens, Yves Lion

Proc. SPIE. 5969, Photonic Applications in Biosensing and Imaging

KEYWORDS: Optical filters, Spatial frequencies, Digital filtering, Interferometry, Phase interferometry, Speckle pattern, Gaussian filters, Image filtering, Shearography, Electronic filtering

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Showing 5 of 13 publications

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