Prof. Fabrizio Bonani
Assistant Professor at Politecnico di Torino
SPIE Involvement:
Conference Program Committee | Conference Chair | Author
Publications (4)

PROCEEDINGS ARTICLE | June 11, 2007
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Instrument modeling, Device simulation, Diodes, Particle filters, Circuit switching, Field effect transistors, Upconversion, Semiconductors, Modulation, Chemical elements

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Modeling, Interference (communication), Semiconductors, Superposition, Instrument modeling, Statistical analysis, Frequency conversion, Upconversion, Stochastic processes, Computer simulations

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Modulation, Instrument modeling, Particle filters, Diffusion, Modeling, Diodes, Chemical elements, Semiconductors, Fermium, Frequency modulation

SPIE Conference Volume | May 25, 2004

Conference Committee Involvement (3)
Noise and Fluctuations in Circuits, Devices, and Materials
21 May 2007 | Florence, Italy
Noise in Devices and Circuits III
24 May 2005 | Austin, Texas, United States
Noise in Devices and Circuits II
26 May 2004 | Maspalomas, Gran Canaria Island, Spain
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