Prof. Fabrizio Bonani
Assistant Professor at Politecnico di Torino
SPIE Involvement:
Conference Program Committee | Conference Chair | Author | Editor
Publications (4)

PROCEEDINGS ARTICLE | June 11, 2007
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Semiconductors, Modulation, Particle filters, Diodes, Field effect transistors, Upconversion, Chemical elements, Circuit switching, Device simulation, Instrument modeling

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Semiconductors, Superposition, Modeling, Statistical analysis, Interference (communication), Computer simulations, Upconversion, Frequency conversion, Stochastic processes, Instrument modeling

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Semiconductors, Modeling, Modulation, Diffusion, Frequency modulation, Particle filters, Diodes, Fermium, Chemical elements, Instrument modeling

SPIE Conference Volume | May 25, 2004

Conference Committee Involvement (3)
Noise and Fluctuations in Circuits, Devices, and Materials
21 May 2007 | Florence, Italy
Noise in Devices and Circuits III
24 May 2005 | Austin, Texas, United States
Noise in Devices and Circuits II
26 May 2004 | Maspalomas, Gran Canaria Island, Spain
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