Dr. Falko Riechert
at Univ Karlsruhe
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 14 September 2010
Proc. SPIE. 7387, Speckle 2010: Optical Metrology
KEYWORDS: Speckle, Cameras, Semiconductor lasers, Speckle pattern, Near field, Projection systems, Microlens, Spatial coherence, Vertical cavity surface emitting lasers, Beam homogenizers

Proceedings Article | 28 April 2010
Proc. SPIE. 7720, Semiconductor Lasers and Laser Dynamics IV
KEYWORDS: Continuous wave operation, Speckle, Cameras, Semiconductor lasers, Speckle pattern, Microlens, Spatial coherence, Vertical cavity surface emitting lasers, Pulsed laser operation, Beam homogenizers

Proceedings Article | 18 June 2007
Proc. SPIE. 6617, Modeling Aspects in Optical Metrology
KEYWORDS: Superposition, Metrology, Statistical analysis, Speckle, Sensors, Surface roughness, Numerical simulations, Speckle pattern, Optical metrology, Spherical lenses

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