Fedor M. Inochkin
at Saint-Petersburg ITMO University
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Diffraction, Point spread functions, Edge detection, Calibration, Image processing, Wavefronts, Computer simulations, 3D metrology, Image retrieval, Digital micromirror devices, Optimization (mathematics), Subpixel image restoration, Temperature metrology

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10333, Optical Methods for Inspection, Characterization, and Imaging of Biomaterials III
KEYWORDS: Diffraction, Optical transfer functions, Digital signal processing, Super resolution, Digital image processing, Modulation, Microscopy, Light scattering, Image restoration, Computing systems, Data acquisition, Spatial light modulators, Double patterning technology, Raster graphics, Digital micromirror devices

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