We present three new interferometric techniques for dispersion characterization covering from millimeter waveguides to kilometers of fibers. The first is a Frequency-Shifted Interferometer (FSI) that measures fibers from meters to tens of kilometers. The second is a three-wave Single-Arm Interferometer (SAI), where the envelope of a three-wave interference pattern yields the second-order dispersion directly. It is suitable for fibers from centimeters to >1m. The
third is a Common-Path Interferometer (CPI) that measures dispersion of millimeter-long fibers/waveguides. These techniques offer high precision in their respective ranges, and are all "single-arm" interferometers: the two interfering beams go through the same arm of the interferometer. They are simple, low-cost, and more resilient to phase and polarization instabilities than conventional interferometric techniques for dispersion measurement.