Dr. Fei Zhang
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 2 November 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Mirrors, Fringe analysis, Defect detection, Mechanics, Speckle, Inspection, Nondestructive evaluation, CCD cameras, Shearography, Phase shifts

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