Dr. Felix Lustenberger
Owner/CEO at LUTECO Lustenberger Technology Consulting
SPIE Involvement:
Senior status | Author
Area of Expertise:
3D-TOF Imaging , Low-Light Imagers , X-Ray Imagers , Intelligent Photonic SOCs , Opto Semiconductor Physics , X-Ray Fluorescence Spectroscopy
Profile Summary

Felix Lustenberger received the diploma (M.Sc.) degree in micro engineering from EPFL, Lausanne, Switzerland, in 1995, and the Dr.Sc. Techn. (Ph.D.) degree in electrical engineering from ETHZ, Zurich, Switzerland, in 2000. From 2001 to 2002, he was also with Snowbush Microelectronics, Toronto, ON, Canada, where he developed cutting-edge mixed-signal circuits for high-speed data communications. In 2002, he joined the Photonics Division of CSEM, Zurich, Switzerland and in 2004, he became the Head of the Image Sensing Group dealing with all aspects of high-performance imaging starting at the semiconductor level and going up to the system-design level for metrology systems of ultimate performance. Since 2007, he is with ESPROS Photonics Corp., Landquart, Switzerland.
Dr. Lustenberger is a senior member of several IEEE societies. From 2007 to 2009, he served as the chair of the Analog Signal Processing Technical Committee of the IEEE Circuits and Systems Society.
Publications (7)

Proc. SPIE. 6996, Silicon Photonics and Photonic Integrated Circuits
KEYWORDS: Near infrared, CMOS sensors, Curtains, Cameras, Sensors, Quantum efficiency, Receivers, Signal processing, Photonics, CMOS technology

SPIE Journal Paper | May 1, 2006
JBO Vol. 11 Issue 03
KEYWORDS: Fluorescence lifetime imaging, Imaging systems, Modulation, Luminescence, Microscopy, Fluorescence resonance energy transfer, Cameras, Microchannel plates, Phase shift keying, Microscopes

PROCEEDINGS ARTICLE | January 26, 2006
Proc. SPIE. 6056, Three-Dimensional Image Capture and Applications VII
KEYWORDS: Modulation, Cameras, Sensors, Image processing, Electrons, Diffusion, Demodulation, Head, Distance measurement, Signal detection

PROCEEDINGS ARTICLE | February 16, 2005
Proc. SPIE. 5663, Photonics in the Automobile
KEYWORDS: Modulation, Imaging systems, Cameras, Sensors, Calibration, Phase shift keying, Stereoscopic cameras, Distance measurement, Phase measurement, 3D-TOF imaging

PROCEEDINGS ARTICLE | January 17, 2005
Proc. SPIE. 5665, Videometrics VIII
KEYWORDS: Sun, Modulation, Cameras, Sensors, Time metrology, Image sensors, Solid state electronics, 3D image processing, Time of flight imaging, 3D-TOF imaging

Proc. SPIE. 5302, Three-Dimensional Image Capture and Applications VI
KEYWORDS: Signal to noise ratio, Mirrors, Modulation, Sensors, Optical coherence tomography, Photons, Demodulation, Image sensors, Signal detection, 3D image processing

Showing 5 of 7 publications
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