Felix Ströer
at Technische Univ Kaiserslautern
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Calibration, Standards development, Metrology, Spatial resolution, Manufacturing, Lithography, Sensor technology

Proceedings Article | 7 September 2018
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Sensors, Deconvolution, Digital holography, Confocal microscopy, Interferometers, Holograms, Surface roughness

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