Fenfen Lin
at Huazhong Univ of Science and technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Confocal microscopy, Beam splitters, Sensors, Microscopy, Optical microscopy, Image resolution, Optical testing, Charge-coupled devices, Optical scanning systems, CCD image sensors

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