Feng Guo
at National Univ of Defense Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 19, 2013
Proc. SPIE. 8905, International Symposium on Photoelectronic Detection and Imaging 2013: Laser Sensing and Imaging and Applications
KEYWORDS: CMOS sensors, Imaging systems, Sensors, Electrodes, Laser induced damage, Laser energy, CCD cameras, Charge-coupled devices, Laser damage threshold, Pulsed laser operation

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top