Dr. Feng Li
at Univ of Shanghai for Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 November 2017 Paper
Feng Li, Xiao Zhang, Rongfu Zhang, Xiaofei Qin
Proceedings Volume 10605, 106054F (2017) https://doi.org/10.1117/12.2296365
KEYWORDS: Microscopes, Berkelium, Device simulation, Defense technologies, Optical microscopes, Scientific research, Interferometry, Optical design, Electron microscopes, Scanning electron microscopy

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