Prof. Feng Li
at Xi'an Jiaotong Univ
SPIE Involvement:
Author
Publications (5)

SPIE Journal Paper | April 26, 2017
OE Vol. 56 Issue 04
KEYWORDS: Clouds, Principal component analysis, Image registration, 3D modeling, Matrices, Optical engineering, Optical scanning, Cameras, Lithium, Manufacturing

PROCEEDINGS ARTICLE | January 17, 2011
Proc. SPIE. 7943, Silicon Photonics VI
KEYWORDS: Semiconductors, Indium arsenide, Resonators, Waveguides, Optical properties, Gallium arsenide, Silicon, Quantum dots, Semiconductor lasers, Optoelectronics

PROCEEDINGS ARTICLE | February 16, 2010
Proc. SPIE. 7591, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics III
KEYWORDS: Semiconductors, Indium gallium arsenide, Resonators, Etching, Gallium arsenide, Quantum dots, Scanning electron microscopy, Laser damage threshold, Optical pumping, Heterojunctions

PROCEEDINGS ARTICLE | February 18, 2009
Proc. SPIE. 7220, Silicon Photonics IV
KEYWORDS: Semiconductors, Resonators, Etching, Luminescence, Gallium arsenide, Silicon, Quantum dots, Scanning electron microscopy, Quantum optics, Heterojunctions

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Signal to noise ratio, Modulation, Scattering, Metals, Diffusion, Resistance, Lab on a chip, Transistors, Field effect transistors, Instrument modeling

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