Feng Li
at Univ of Shanghai for Science and Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 14 November 2007
Proc. SPIE. 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
KEYWORDS: Refractive index, Visible radiation, Lithium, Finite-difference time-domain method, Waveguides, Dielectrics, Silicon, Photonic crystals, Negative refraction, Electromagnetism

Proceedings Article | 14 November 2007
Proc. SPIE. 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
KEYWORDS: Refractive index, Lithium, Finite-difference time-domain method, Waveguides, Dielectrics, Silicon, Photonic crystals, Negative refraction, Electromagnetism, Light wave propagation

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