Dr. Feng Zhang
at Beijing Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 August 2015
Proc. SPIE. 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Temperature metrology, Aluminum, Surface roughness, Black bodies, Environmental sensing, Infrared radiation, Radiation effects, Iron, Surface finishing, Oxidation

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