Feng Zhang
at SIMT
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 November 2019
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Metrology, Genetic algorithms, 3D acquisition, 3D imaging standards, Aerospace engineering, Calibration, Laser applications, Measurement devices, Optimization (mathematics), Environmental sensing

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