Fengge Wang
at Nanjing Normal Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 November 2018 Paper
Proceedings Volume 10964, 109643H (2018) https://doi.org/10.1117/12.2505948
KEYWORDS: Dielectrics, Silica, Scanning electron microscopy, Geometrical optics, Thin films, Super resolution, Imaging arrays, Image enhancement, Silver, Refractive index

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