Dr. Fermín Salomón Granados-Agustín
Research at INAOE
SPIE Involvement:
Author
Area of Expertise:
OPTICAL TESTING , INTERFEROMETRY
Profile Summary

Fermín Granados-Agustín is a researcher with the Optics Department of the National Institute of Astrophysics, Optics, and Electronics INAOE, Mexico. He received his BS degree in physics from the National University of Mexico UNAM in 1993. He received his MS degree and PhD degree in optics, respectively in 1995 and 1998, both from the INAOE. He is a national researcher for the National System of Researches, Mexico. He held a postdoctoral position at the Mirror Lab of the Steward Observatory at the University of Arizona in 1999. He has been the head of the optical shop at INAOE since 2005. His research interests include optical information, Interferometric optical testing, and instrumentation.
Publications (62)

SPIE Journal Paper | October 25, 2018
OE Vol. 57 Issue 10
KEYWORDS: Visibility, Optical engineering, Optical fabrication, Spherical lenses, Ronchi rulings, Wavefronts, Optical testing, Visual analytics, Visualization, Interferometry

PROCEEDINGS ARTICLE | September 19, 2018
Proc. SPIE. 10747, Optical System Alignment, Tolerancing, and Verification XII
KEYWORDS: Diffraction, Telescopes, Mirrors, Segmented mirrors, Sun, Sensors, Image segmentation, Optical alignment, Large telescopes, James Webb Space Telescope

PROCEEDINGS ARTICLE | September 14, 2018
Proc. SPIE. 10742, Optical Manufacturing and Testing XII
KEYWORDS: Elliptical polarization, Cadmium, Polarization, Sensors, Polarizers, Adaptive optics, Modulators, Spatial light modulators, Laser stabilization, Liquid crystals

PROCEEDINGS ARTICLE | September 14, 2018
Proc. SPIE. 10742, Optical Manufacturing and Testing XII
KEYWORDS: Cameras, Image processing, Photography, Wavefronts, Numerical simulations, Deflectometry, Refraction, Ray tracing, Aspheric lenses, Geometrical optics

PROCEEDINGS ARTICLE | September 14, 2018
Proc. SPIE. 10742, Optical Manufacturing and Testing XII
KEYWORDS: Thin films, Fringe analysis, Optical lithography, Point diffraction interferometers, Image processing, Mercury, Wavefronts, Aluminum, Deposition processes, Spherical lenses

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI
KEYWORDS: Software, Modeling, Monochromatic aberrations, Reflection, Sensors, Wavefronts, Numerical simulations, Optical metrology, Deflectometry, Refraction, LCDs, Ray tracing, Precision measurement, Aspheric lenses, Geometrical optics, Spherical lenses, Systems modeling

Showing 5 of 62 publications
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