Prof. Ferran Laguarta
at Univ Politècnica de Catalunya
SPIE Involvement:
Author
Publications (15)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10334, Automated Visual Inspection and Machine Vision II
KEYWORDS: Image visualization, Defect detection, Visualization, Cameras, Microscopy, Inspection, Optical inspection, Process control, Objectives, Image classification, Binary data, Line scan image sensors

PROCEEDINGS ARTICLE | February 20, 2017
Proc. SPIE. 10110, Photonic Instrumentation Engineering IV
KEYWORDS: Confocal microscopy, Microscopes, Metrology, Cameras, Microscopy, Interfaces, Coating, Inspection, Interferometry, Optical inspection, 3D metrology, Objectives, Reflectance spectroscopy, 3D image processing

PROCEEDINGS ARTICLE | September 22, 2011
Proc. SPIE. 8169, Optical Fabrication, Testing, and Metrology IV
KEYWORDS: Confocal microscopy, Metrology, Sensors, Calibration, Error analysis, 3D metrology, Aspheric lenses, Freeform optics, Spherical lenses, Optics manufacturing

PROCEEDINGS ARTICLE | June 18, 2007
Proc. SPIE. 6616, Optical Measurement Systems for Industrial Inspection V
KEYWORDS: Confocal microscopy, Thin films, Refractive index, Light sources, Interfaces, Silicon, Profiling, Objectives, Semiconducting wafers, Blue light emitting diodes

PROCEEDINGS ARTICLE | September 10, 2004
Proc. SPIE. 5457, Optical Metrology in Production Engineering
KEYWORDS: Confocal microscopy, Microscopes, Interferometers, Sensors, Inspection, Head, Profiling, 3D metrology, Objectives, Standards development

PROCEEDINGS ARTICLE | September 10, 2004
Proc. SPIE. 5457, Optical Metrology in Production Engineering
KEYWORDS: Confocal microscopy, Backscatter, Polymers, Printing, Profiling, 3D metrology, Objectives, Excimer lasers, Charge-coupled devices, Surface finishing

Showing 5 of 15 publications
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