Prof. Fikret N. Hacizade
Project Leader at TÜBITAK UEKAE
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | May 13, 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Reflection, Glasses, Coating, Manufacturing, Reflectivity, Control systems, Head, Color difference, Transmittance, Spectrophotometry

PROCEEDINGS ARTICLE | May 11, 2012
Proc. SPIE. 8433, Laser Sources and Applications
KEYWORDS: Mirrors, Scattering, Sensors, Light scattering, Optical coatings, Laser scattering, Reflectivity, Optical testing, Transmittance, Signal detection

PROCEEDINGS ARTICLE | May 5, 2012
Proc. SPIE. 8430, Optical Micro- and Nanometrology IV
KEYWORDS: Microfluidics, Light emitting diodes, LED lighting, Imaging systems, Cameras, Sensors, Particles, CCD cameras, Velocity measurements, CCD image sensors

PROCEEDINGS ARTICLE | May 6, 2010
Proc. SPIE. 7723, Optics, Photonics, and Digital Technologies for Multimedia Applications
KEYWORDS: Imaging systems, Spatial frequencies, Speckle, Sensors, Image processing, Speckle pattern, Charge-coupled devices, Modulation transfer functions, Spatial resolution, CCD image sensors

PROCEEDINGS ARTICLE | November 4, 2003
Proc. SPIE. 5226, 12th International School on Quantum Electronics: Laser Physics and Applications
KEYWORDS: Visible radiation, FT-IR spectroscopy, Ultraviolet radiation, Luminescence, Silicon, Picosecond phenomena, Quantum electronics, Semiconducting wafers, Absorption, Oxidation

PROCEEDINGS ARTICLE | June 10, 1996
Proc. SPIE. 2801, Nonlinear Optics of Low-Dimensional Structures and New Materials
KEYWORDS: Amorphous silicon, Phase modulation, Spectroscopy, Semiconductor lasers, Time metrology, Solids, Sapphire lasers, Laser beam diagnostics, Nonlinear response, Absorption

Showing 5 of 6 publications
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