Dr. Florent Pigeon Profile

Dr. Florent Pigeon

at Univ Jean Monnet Saint-Etienne

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Author

Publications (15)

Proceedings Article | 13 March 2024 Presentation

Laser-induced surface organization on the nanoscale guided by machine learning

Jean-Philippe Colombier, Eduardo Brandao, Anthony Nakhoul, Rémi Emonet, Amaury Habrard, Florence Garrelie, François Jacquenet, Florent Pigeon, Marc Sebban

Proceedings Volume PC12873, PC128730D (2024) https://doi.org/10.1117/12.3000894

KEYWORDS: Natural surfaces, Machine learning, Laser irradiation, Ultrafast phenomena, Systems modeling, Nonlinear optics, Nanostructures, Modeling, Materials properties, Complex systems

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Proceedings Article | 1 April 2022 Presentation

Surface morphologies at nanometric scale by temporal and polarization control of ultrashort laser pulses

Anthony Nakhoul, Claire Maurice, Stéphanie Reynaud, Florence Garrelie, Florent Pigeon, Jean-Philippe Colombier

Proceedings Volume PC11988, PC119880C (2022) https://doi.org/10.1117/12.2605734

KEYWORDS: Ultrafast phenomena, Polarization control, Nanostructures, Pulsed laser operation, Biomedical optics, Switches, Surface roughness, Surface properties, Natural surfaces, Nanostructuring

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Proceedings Article | 21 November 2017 Open Access

The potential of diffraction grating for spatial applications

Y. Jourlin, O. Parriaux, F. Pigeon, A. Tischenko

Proceedings Volume 10569, 105691B (2017) https://doi.org/10.1117/12.2307935

KEYWORDS: Diffraction gratings, Polarization, Sensors, Laser stabilization, Mirrors, Aerospace engineering, Reflection, Head, YAG lasers, Diffraction

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Proceedings Article | 25 April 2006 Paper

Associating a lossless polarizing function in multilayer laser mirrors by means of a resonant grating

O. Parriaux, A. Tishchenko, F. Pigeon

Proceedings Volume 6187, 61870B (2006) https://doi.org/10.1117/12.668368

KEYWORDS: Polarization, Mirrors, Reflection, Optical filters, Waveguides, Metals, Wave propagation, Refractive index, Diffraction gratings, Dielectric polarization

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Proceedings Article | 25 February 2004 Paper

Wafer-scale measurement of the modes of a dielectric multilayer

Marwan Ahmed, Florent Pigeon, Olivier Parriaux, Svetlen Tonchev, Nikolay Lyndin

Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.513690

KEYWORDS: Semiconducting wafers, Multilayers, Hybrid fiber optics, Thin films, Mirrors, Dielectrics, Manufacturing, Waveguides, Optics manufacturing, Refractive index

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Proceedings Article | 25 February 2004 Paper

Flux resistance degradation in resonant grating multilayer mirror

Marwan Ahmed, Jean Claude Pommier, Florent Pigeon, Olivier Parriaux

Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.513692

KEYWORDS: Laser damage threshold, Mirrors, Dielectric polarization, Polarization, Waveguides, Nd:YAG lasers, Resistance, Hybrid fiber optics, Multilayers, Optical filters

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Proceedings Article | 25 February 2004 Paper

Technology trimming of a resonant multilayer laser polarizer

Marwan Ahmed, Jean Claude Pommier, Florent Pigeon, Stephanie Reynaud, Youcef Ouerdane

Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.513691

KEYWORDS: Mirrors, Metals, Polarization, Dielectric polarization, Multilayers, Diffraction gratings, Laser applications, Polarizers, Nd:YAG lasers, Tantalum

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Proceedings Article | 18 February 2004 Paper

Single order Fabry-Perot polarizing laser mirror

Marwan Ahmed, Alexandre Tishchenko, Florent Pigeon, Olivier Parriaux

Proceedings Volume 5249, (2004) https://doi.org/10.1117/12.513689

KEYWORDS: Mirrors, Electronic filtering, Waveguides, Polarization, Fabry–Perot interferometers, Resonators, Optical filters, Reflection, Reflectivity, Wave propagation

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Proceedings Article | 3 April 2003 Paper

Integrated polarizing function for solid state lasers

Marwan Ahmed, Florent Pigeon, Alexandre Tishchenko, Olivier Parriaux, Youcef Ouerdane, Stephanie Reynaud, Jean Pommier, Svetlen Tonchev

Proceedings Volume 4944, (2003) https://doi.org/10.1117/12.472437

KEYWORDS: Polarization, Mirrors, Nd:YAG lasers, Diffraction gratings, Tantalum, Solid state lasers, Multilayers, Reflection, Spectroscopy, Etching

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Proceedings Article | 9 November 2001 Paper

Microelectronics planar technologies for the manufacturing of high spatial frequency gratings: sub-angstroem assessment of spatial coherence

Olivier Parriaux, Y. Jourlin, Florent Pigeon, G. Bouchet, Paul Van Dijk, Rudy Pellens, Suat Topcu, Yasser Alayli, Marc Bonis

Proceedings Volume 4440, (2001) https://doi.org/10.1117/12.448042

KEYWORDS: Diffraction gratings, Sensors, Head, Diffraction, Spatial frequencies, Spatial coherence, Semiconducting wafers, Phase measurement, Microelectronics, Manufacturing

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Proceedings Article | 15 September 1999 Paper

Bondability of processed glass wafers

Gregory Pandraud, Cheng-Qun Gui, Florent Pigeon, Paul Lambeck, Olivier Parriaux

Proceedings Volume 3825, (1999) https://doi.org/10.1117/12.364303

KEYWORDS: Semiconducting wafers, Wafer bonding, Waveguides, Glasses, Surface roughness, Ion exchange, Ions, Radium, Channel waveguides, Optical spheres

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The mechanism of direct bonding at room temperature has been attributed to the short range inter-molecular and inter-atomic attraction forces, such as Van der Waals forces. Consequently, the wafer surface smoothness becomes one of the most critical parameters in this process. High surface roughness will result in small real area of contact, and therefore yield voids in the bonding interface. Usually, the root mean square roughness (RMS) or the mean roughness (Ra) are used as parameters to evaluate the wafer bondability. It was found from experience that for a bondable wafer surface the mean roughness must be in the subnanometer range, preferentially less than 0.5 nm. When the surface roughness exceeds a critical value, the wafers will not bond at all. However RMS and Ra were found to be not sufficient for evaluating the wafer bondability. Hence one tried to relate wafer bonding to the spatial spectrum of the wafer surface profile and indeed some empirical relations that have been found. The first, who proposed a theory on the problem of the closing gaps between contacted wafers was Stengl. This gap-closing theory was then further developed by Tong and Gosele. The elastomechanics theory was used to study the balance between the decrease of surface energy due to the bonding and the increase of elastic energy due to the distortion of the wafer. They considered the worst case by assuming that both wafers have a waviness, with a wavelength (lambda) and a height amplitude h, resulting in a gap height of 2h in a head to head position. This theory is simple and can be used in practice, for studying the formation of the voids, or for constructing design rules for the bonding of deliberately structured wafers. But it is insufficient to know what is the real area of contact in the wafer interface after contact at room temperature because the wafer surface always possesses a random distribution of the surface topography. Therefore Gui developed a continuous model on the influence of the surface roughness to wafer bonding, that is based on a statistical surface roughness model Pandraud demonstrated experimentally that direct bonding between processed glass wafers is possible. This result cannot be explained by considering the RMS value of the surfaces only, because the wafers used show a RMS value larger than 1 nm. Based on the approach exposed in reference six, a rigorous analysis of wafer bonding of these processed glass wafers is presented. We will discuss the relation between the bonding process and different waveguide technologies used for implementing optical waveguides into one or both glass wafers, and give examples of optical devices benefiting from such a bonding process.

Proceedings Article | 10 March 1999 Paper

High-spatial-frequency grating technology for microsystem applications

Olivier Parriaux, Florent Pigeon, Y. Jourlin, Alain Mure-Ravaud, Alexandre Tishchenko

Proceedings Volume 3680, (1999) https://doi.org/10.1117/12.341255

KEYWORDS: Diffraction gratings, Sensors, Optics manufacturing, Beam splitters, Waveguides, Microsystems, Spatial frequencies, Laser applications, Manufacturing, Molecules

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SPIE Journal Paper | 1 April 1998

New technique to produce buried channel waveguides in glass

Serge Pelissier, Florent Pigeon, B. Biasse, M. Zussy, Gregory Pandraud, Alain Mure-Ravaud

OE, Vol. 37, Issue 04, (April 1998) https://doi.org/10.1117/12.10.1117/1.601647

KEYWORDS: Channel waveguides, Semiconducting wafers, Waveguides, Wafer bonding, Ion exchange, Glasses, Wafer-level optics, Polishing, Near field, Image processing

Proceedings Article | 26 August 1996 Paper

Glass wafer direct bonding: a new technology for monomode optical integrated devices

Serge Pelissier, Gregory Pandraud, Florent Pigeon, Alain Mure-Ravaud, Jean-Pierre Meunier, B. Biasse

Proceedings Volume 2783, (1996) https://doi.org/10.1117/12.248512

KEYWORDS: Waveguides, Semiconducting wafers, Glasses, Wafer bonding, Integrated optics, Ion exchange, Wafer-level optics, Near field, Planar waveguides

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Proceedings Article | 19 August 1996 Paper

New assembly technique for deeply buried optical waveguides

Alain Mure-Ravaud, Serge Pelissier, Florent Pigeon, B. Biasse, Gregory Pandraud

Proceedings Volume 2775, (1996) https://doi.org/10.1117/12.246788

KEYWORDS: Waveguides, Semiconducting wafers, Wafer bonding, Integrated optics, Near field optics, Glasses, Ion exchange, Optical properties, Near field, Planar waveguides

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Showing 5 of 15 publications

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