Prof. Florian Meirer
at Utrecht Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 September 2019
Proc. SPIE. 11112, X-Ray Nanoimaging: Instruments and Methods IV
KEYWORDS: X-ray optics, Lenses, Microscopy, X-rays, X-ray microscopy, Tomography, Spatial resolution, Beryllium, Hard x-rays

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