Forrest R. Ruhge
at Siemens AG
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 August 2004
Proc. SPIE. 5406, Infrared Technology and Applications XXX
KEYWORDS: Optical filters, Polishing, Spectroscopy, Copper, Gallium arsenide, Diffusion, Infrared radiation, Absorption filters, Surface finishing, Absorption

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