Dr. Francesco Grasso
Engineer at Univ. degli Studi di Firenze
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 30, 2005
Proc. SPIE. 5837, VLSI Circuits and Systems II
KEYWORDS: Statistical analysis, Argon, Manufacturing, Chromium, Computer simulations, Monte Carlo methods, Computer aided design, Analog electronics, Tolerancing, Device simulation

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top