Javier Francisco Rodríguez
at LOMG
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | September 13, 2012
Proc. SPIE. 8493, Interferometry XVI: Techniques and Analysis
KEYWORDS: Refractive index, Interferometers, Calibration, Interferometry, Phase shift keying, Control systems, Semiconductor lasers, Humidity, Diodes, Absorption

PROCEEDINGS ARTICLE | September 25, 2008
Proc. SPIE. 7102, Optical Fabrication, Testing, and Metrology III
KEYWORDS: Beam splitters, Fringe analysis, Diamond, Metrology, Fluctuations and noise, Fourier transforms, Interferometry, CMOS cameras, Fluid dynamics, Diamond patterning

PROCEEDINGS ARTICLE | June 13, 2005
Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV
KEYWORDS: Holography, Ultrasonography, Inspection, Fourier transforms, Wave plates, Ultrasonics, Wave propagation, Aluminum, Acoustics, Phase velocity

PROCEEDINGS ARTICLE | June 13, 2005
Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV
KEYWORDS: Fringe analysis, Mach-Zehnder interferometers, Visualization, Interferometers, Ceramics, Laser processing, Materials processing, Fourier transforms, Interferometry, Laser cutting

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