Dr. François A. Polack
at
SPIE Involvement:
Conference Program Committee | Author
Publications (12)

Proceedings Article | 12 May 2015
Proc. SPIE. 9512, Advances in X-ray Free-Electron Lasers Instrumentation III
KEYWORDS: Electron beams, Spectroscopy, Magnetism, Diagnostics, Optical testing, Colorimetry, Synchrotrons, Electron transport, Free electron lasers, Plasma

Proceedings Article | 26 September 2013
Proc. SPIE. 8851, X-Ray Nanoimaging: Instruments and Methods
KEYWORDS: Diffraction, Point spread functions, Mirrors, X-ray optics, Metrology, X-rays, Reflectivity, Nanoprobes, Tolerancing, Hard x-rays

Proceedings Article | 26 September 2013
Proc. SPIE. 8851, X-Ray Nanoimaging: Instruments and Methods
KEYWORDS: Coherence imaging, Mirrors, Mechanics, Imaging systems, X-rays, Nanoprobes, Synchrotrons, Spatial resolution, Monochromators, X-ray imaging

Proceedings Article | 3 October 2008
Proc. SPIE. 7155, Ninth International Symposium on Laser Metrology
KEYWORDS: Point spread functions, Mirrors, Spatial frequencies, Sensors, X-rays, Wavefronts, Head, Synchrotrons, Spatial resolution, Surface finishing

Proceedings Article | 18 June 2007
Proc. SPIE. 6616, Optical Measurement Systems for Industrial Inspection V
KEYWORDS: Mirrors, Metrology, Calibration, Wavefront sensors, Wavefronts, Head, Microlens, Synchrotrons, Spherical lenses, Surface finishing

Proceedings Article | 15 September 2005
Proc. SPIE. 5921, Advances in Metrology for X-Ray and EUV Optics
KEYWORDS: Mirrors, Prisms, Polarization, Interferometers, Calibration, Interferometry, Optical testing, Head, Synchrotrons, Laser beam diagnostics

Showing 5 of 12 publications
Conference Committee Involvement (5)
Advances in Computational Methods for X-Ray Optics III
19 August 2014 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics IV
12 August 2012 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics III
1 August 2010 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics II
30 August 2007 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics
2 August 2005 | San Diego, California, United States
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